I served as Harshit Agrawal’s opponent when he defended his doctoral thesis Deep learning-based metal and scatter artifact reduction in cone-beam computed tomography on October 24, 2025 in Aalto University. We had a wonderful scientific discussion. I am so impressed by his creative use of modern AI methods in medical X-ray imaging. Especially powerful is his demonstration of the methods with actual measured data he collected with the devices manufactured at his employer, Planmeca corp.
PhD defense of Harshit Agrawal
